FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers

Published in IEEE/ACM International Conference on Automated Software Engineering (ASE), 2023

Recommended citation: Eric Liu, Shengjie Xu, and David Lie. "FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers". In Proceedings of The 38th IEEE/ACM International Conference on Automated Software Engineering (ASE 2023), September 2023.
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